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Machine learning applied to single-shot x-ray diagnostics in an XFEL

Oct 11, 2016
A. Sanchez-Gonzalez, P. Micaelli, C. Olivier, T. R. Barillot, M. Ilchen, A. A. Lutman, A. Marinelli, T. Maxwell, A. Achner, M. Agåker, N. Berrah, C. Bostedt, J. Buck, P. H. Bucksbaum, S. Carron Montero, B. Cooper, J. P. Cryan, M. Dong, R. Feifel, L. J. Frasinski, H. Fukuzawa, A. Galler, G. Hartmann, N. Hartmann, W. Helml, A. S. Johnson, A. Knie, A. O. Lindahl, J. Liu, K. Motomura, M. Mucke, C. O'Grady, J-E. Rubensson, E. R. Simpson, R. J. Squibb, C. Såthe, K. Ueda, M. Vacher, D. J. Walke, V. Zhaunerchyk, R. N. Coffee, J. P. Marangos

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